COMPMID-1652 NEON Remove unnecessary configuration tests
Change-Id: Iba0739450c144dde141de1f2a3864cecc93c8266
Reviewed-on: https://review.mlplatform.org/527
Reviewed-by: Isabella Gottardi <isabella.gottardi@arm.com>
Tested-by: Arm Jenkins <bsgcomp@arm.com>
diff --git a/tests/validation/NEON/NonLinearFilter.cpp b/tests/validation/NEON/NonLinearFilter.cpp
index 541e870..b3d4c93 100644
--- a/tests/validation/NEON/NonLinearFilter.cpp
+++ b/tests/validation/NEON/NonLinearFilter.cpp
@@ -1,5 +1,5 @@
/*
- * Copyright (c) 2017 ARM Limited.
+ * Copyright (c) 2017-2019 ARM Limited.
*
* SPDX-License-Identifier: MIT
*
@@ -41,7 +41,7 @@
TEST_SUITE(NEON)
TEST_SUITE(NonLinearFilter)
-DATA_TEST_CASE(Configuration, framework::DatasetMode::ALL, combine(combine(combine(combine(concat(datasets::SmallShapes(), datasets::LargeShapes()), datasets::NonLinearFilterFunctions()),
+DATA_TEST_CASE(Configuration, framework::DatasetMode::ALL, combine(combine(combine(combine(datasets::SmallShapes(), datasets::NonLinearFilterFunctions()),
framework::dataset::make("MaskSize", { 3U, 5U })),
datasets::MatrixPatterns()),
datasets::BorderModes()),