commit eb1f9cfac44cca8e0330b5918fa907ee0b32f9bf
author Ryan OShea <Ryan.OShea2@arm.com> Thu May 21 17:07:40 2020 +0100
committer Ryan O'Shea <ryan.oshea2@arm.com> Mon May 25 10:09:21 2020 +0000
tree 3fe1c932cf02d2c9bc41e8c0f73e25e1ed85be76
parent badcc3f56dcd3627d8efc2678e5ad5449225fcb9

IVGCVSW-4186 Add EXP unit tests for TfLiteParser

 * Updated Documentation
 * Created unit test file

Signed-off-by: Ryan OShea <Ryan.OShea2@arm.com>
Change-Id: Ic8384b5ed21ac53f918860be8a98c0ac7477d0e1

CMakeLists.txt

diff --git a/CMakeLists.txt b/CMakeLists.txt
index 9998038..692bc04 100644
--- a/CMakeLists.txt
+++ b/CMakeLists.txt
@@ -769,6 +769,7 @@
              src/armnnTfLiteParser/test/DepthwiseConvolution2D.cpp
              src/armnnTfLiteParser/test/Dequantize.cpp
              src/armnnTfLiteParser/test/DetectionPostProcess.cpp
+             src/armnnTfLiteParser/test/Exp.cpp
              src/armnnTfLiteParser/test/FullyConnected.cpp
              src/armnnTfLiteParser/test/L2Normalization.cpp
              src/armnnTfLiteParser/test/Maximum.cpp