| // |
| // Copyright © 2021 Arm Ltd and Contributors. All rights reserved. |
| // SPDX-License-Identifier: MIT |
| // |
| |
| #include "NeonWorkloadFactoryHelper.hpp" |
| |
| #include <neon/NeonWorkloadFactory.hpp> |
| #include <test/UnitTests.hpp> |
| |
| #include <doctest/doctest.h> |
| |
| TEST_SUITE("Compute_ArmComputeNeon") |
| { |
| using namespace armnn; |
| |
| using FactoryType = NeonWorkloadFactory; |
| |
| // ============================================================================ |
| // This is a specific subset of NeonLayerTests that can fail because of a known problem |
| // in the Android NDK. https://github.com/android/ndk/issues/1135 |
| // We extract them here so then in the case of a debug Android build they can be excluded. |
| // The tests will pass in a release build. The problem has been corrected in NDK r21. |
| |
| // Softmax |
| ARMNN_AUTO_TEST_CASE_WITH_THF(SimpleSoftmaxBeta1, SimpleSoftmaxTest, 1.0f) |
| ARMNN_AUTO_TEST_CASE_WITH_THF(SimpleSoftmaxBeta2, SimpleSoftmaxTest, 2.0f) |
| |
| // LogSoftmax |
| ARMNN_AUTO_TEST_CASE_WITH_THF(LogSoftmaxFloat32_1, LogSoftmaxTest1<DataType::Float32>) |
| |
| ARMNN_AUTO_TEST_CASE_WITH_THF(L2Normalization1dNhwc, L2Normalization1dTest, DataLayout::NHWC) |
| |
| ARMNN_AUTO_TEST_CASE_WITH_THF(LstmLayerFloat32NoCifgWithPeepholeWithProjectionWithLayerNorm, |
| LstmLayerFloat32NoCifgWithPeepholeWithProjectionWithLayerNormTest) |
| |
| // ReduceSum |
| ARMNN_AUTO_TEST_CASE_WITH_THF(ReduceSumFloat32, ReduceSumSimpleTest<DataType::Float32>) |
| |
| ARMNN_AUTO_TEST_CASE_WITH_THF(ReduceSumSingleAxisFloat32_3, ReduceSumSingleAxisTest3<DataType::Float32>) |
| |
| #if defined(ARMNNREF_ENABLED) |
| |
| ARMNN_COMPARE_REF_AUTO_TEST_CASE_WITH_THF(CompareSoftmaxBeta1WithReference, CompareSoftmaxTest, 1.0f) |
| ARMNN_COMPARE_REF_AUTO_TEST_CASE_WITH_THF(CompareSoftmaxBeta2WithReference, CompareSoftmaxTest, 2.0f) |
| |
| #endif |
| |
| } |