blob: ed8d31cc80c3b07c70a4ea2abe4390f04f8a8ffe [file] [log] [blame]
//
// Copyright © 2021 Arm Ltd and Contributors. All rights reserved.
// SPDX-License-Identifier: MIT
//
#include "NeonWorkloadFactoryHelper.hpp"
#include <UnitTests.hpp>
#include <backendsCommon/test/LayerTests.hpp>
#include <neon/NeonWorkloadFactory.hpp>
#include <doctest/doctest.h>
TEST_SUITE("Compute_ArmComputeNeon")
{
using namespace armnn;
using FactoryType = NeonWorkloadFactory;
// ============================================================================
// This is a specific subset of NeonLayerTests that can fail because of a known problem
// in the Android NDK. https://github.com/android/ndk/issues/1135
// We extract them here so then in the case of a debug Android build they can be excluded.
// The tests will pass in a release build. The problem has been corrected in NDK r21.
// Softmax
ARMNN_AUTO_TEST_CASE_WITH_THF(SimpleSoftmaxBeta1, SimpleSoftmaxTest, 1.0f)
ARMNN_AUTO_TEST_CASE_WITH_THF(SimpleSoftmaxBeta2, SimpleSoftmaxTest, 2.0f)
// LogSoftmax
ARMNN_AUTO_TEST_CASE_WITH_THF(LogSoftmaxFloat32_1, LogSoftmaxTest1<DataType::Float32>)
ARMNN_AUTO_TEST_CASE_WITH_THF(L2Normalization1dNhwc, L2Normalization1dTest, DataLayout::NHWC)
ARMNN_AUTO_TEST_CASE_WITH_THF(LstmLayerFloat32NoCifgWithPeepholeWithProjectionWithLayerNorm,
LstmLayerFloat32NoCifgWithPeepholeWithProjectionWithLayerNormTest)
ARMNN_AUTO_TEST_CASE_WITH_THF(UnidirectionalSequenceLstmLayerNoCifgWithPeepholeWithProjectionWithLayerNorm,
UnidirectionalSequenceLstmLayerNoCifgWithPeepholeWithProjectionWithLayerNormTest)
// ReduceSum
ARMNN_AUTO_TEST_CASE_WITH_THF(ReduceSumFloat32, ReduceSumSimpleTest<DataType::Float32>)
ARMNN_AUTO_TEST_CASE_WITH_THF(ReduceSumSingleAxisFloat32_3, ReduceSumSingleAxisTest3<DataType::Float32>)
#if defined(ARMNNREF_ENABLED)
ARMNN_COMPARE_REF_AUTO_TEST_CASE_WITH_THF(CompareSoftmaxBeta1WithReference, CompareSoftmaxTest, 1.0f)
ARMNN_COMPARE_REF_AUTO_TEST_CASE_WITH_THF(CompareSoftmaxBeta2WithReference, CompareSoftmaxTest, 2.0f)
#endif
}